AI-Driven Early Detection Systems for Plant Pathogens

Authors

  • Andreas Ivanov Professor Author

DOI:

https://doi.org/10.62649/v14.i01.2026.pp26-34

Keywords:

Plant pathogen detection, Deep learning, yperspectral imaging, VOC biosensors

Abstract

Plant pathogens--including fungal, bacterial, viral, and oomycete agents--cause an estimated 10-16% annual global crop
yield loss, with early and accurate detection being the most critical determinant of effective disease management and
yield protection. This study develops and benchmarks an integrated AI-driven early detection system combining
hyperspectral imaging, volatile organic compound (VOC) sensor arrays, and environmental monitoring with deep learning
classification for six high-priority plant pathogens across three crops: Fusarium head blight (wheat), Phytophthora
infestans (potato), Botrytis cinerea (tomato), Xanthomonas oryzae (rice), Erwinia amylovora (apple), and Puccinia
striiformis (wheat) at experimental facilities in Estonia, Austria, and Switzerland. A multi-modal fusion architecture
integrating ResNet-50 hyperspectral image features, 1D-CNN VOC sensor fingerprints, and environmental condition
embeddings achieved overall pathogen detection F1-score of 0.934 at pre-symptomatic infection stages (2-12 days
post-inoculation), compared to F1=0.847 for hyperspectral-only and F1=0.791 for VOC-only detection. Detection lead
time relative to visible symptom appearance ranged from 3 days (Botrytis, tomato) to 11 days (Fusarium, wheat). The
system achieved sensitivity of 91.4% and specificity of 93.8% across all pathogen-crop combinations, demonstrating
practical viability for deployment as an integrated greenhouse and field crop health monitoring system.

Downloads

Published

01-01-2026

How to Cite

AI-Driven Early Detection Systems for Plant Pathogens. (2026). Indo-American Journal of Agricultural and Veterinary Sciences, 14(01), 26-34. https://doi.org/10.62649/v14.i01.2026.pp26-34

Similar Articles

1-10 of 36

You may also start an advanced similarity search for this article.